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Djerdj, Igor ; Gracin, Davor ; Juraić, Krunoslav ; Marinović, Adam ; Balzar, Davor
Microstructural and optical study of inhomogeneous SnO2 thin films // ISMANAM 2012 : Book of abstracts. 2012
Gracin, Davor ; Juraić, Krunoslav ; Djerdj, Igor ; Lausi, Andrea ; Čeh, Miran ; Balzar, Davor
Nano Structure of In-homogeneous Amorphous-nano-crystalline Si Thin Films by Grazing Incidence X-ray Diffraction // BITS 1st Annual Conference and Expo of Analytix-2012 / Xiaodan Mei (ur.). Peking: BIT Congress Inc., 2012. str. 145-145
Juraić, Krunoslav ; Gracin, Davor ; Djerdj, Igor ; Lausi, Andrea ; Čeh, Miran ; Balzar, Davor
Structural Analysis of Amorphous-Nanocrystalline Silicon Thin Films by Grazing Incidence X-ray Diffraction // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 284 (2012), 78-82. doi: 10.1016/j.nimb.2011.07.018
Juraić, Krunoslav ; Gracin, Davor ; Djerdj, Igor ; Lausi, Andrea ; Čeh, Miran ; Balzar, Davor
GIXRD analysis of amorphous-nanocrystalline silicon thin films // Knjiga sažetaka: Sedmi znanstveni sastanak Hrvatskog fizikalnog društva / Gajović, A (ur.). Zagreb: Hrvatsko fizikalno društvo, 2011. str. 139-139
Juraić K. ; Gracin D. ; Djerdj, I. ; Lausi A. ; Čeh, M. ; Balzar D.
Structural Analysis of amorphous-nanocrystalline silicon thin films by Grazing Incidence X-ray Diffraction. 2011
Djerdj, Igor ; Gracin, Davor ; Juraić, Krunoslav ; Meljanac, Daniel ; Balzar, Davor
Structural analysis of inhomogeneous SnOx thin films // Denver X-ray conference : abstracts. 2011
Gall, Ken ; Dunn, Martin ; Liu, Yiping ; Štefanić, Goran ; Balzar, Davor
Internal stress storage in shape memory polymer nanocomposites // Applied physics letters, 85 (2004), 2; 290-292-x
Popa, Nicolae ; Balzar, Davor ; Štefanić, Goran ; Vogel, Sven ; Brown, Donald ; Bourke, Mark ; Clausen, Bjorn
Residual-Strain Determination by Least-Squares Refinement of TOF Neutron-Diffraction Measurements of Deformed Uranium // Advances in X-ray Analysis. 2004. str. 373-378
Balzar, Davor
Line-profile analysis and standards // Abstracts of the
6th Powder Diffraction Conference EPDIC-6 / Ungar, Tamas ; Svab, Erzsebet (ur.). Budimpešta: Diffraction Division ofthe Roland Eotvos Physical Society, Hunga, 1998. str. 11-x
Balzar, Davor ; Stephens, P.W ; Ledbetter, H ;
Synchrotron X-ray Diffraction Line Profile // Fizika A, 6 (1997), 41-50
