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ASIC testing from the customer point of view (CROSBI ID 146794)
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Švedek, Tomislav ; B.Žak ; S.Ursić
ASIC testing from the customer point of view // Microelectronics journal, 5 (1988), 4; 21-32
Podaci o odgovornosti
Švedek, Tomislav ; B.Žak ; S.Ursić
engleski
ASIC testing from the customer point of view
The authors deal with the problem of ASIC testing from the customer point of view. The question of test methods for relatively low complexity circuits is emphasised. For digital ASIC testing, functional vs. gate-level testing is discussed, DFT principles are reviewed and an example of functional testing of ASICs from the industrial field of application is shown. Analogue circuit test procedures are illustrated by the example of hybrid ASIC testing
ASIC; testing; customer
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