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Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study (CROSBI ID 211161)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Runte, Sven ; Lazić, Predrag ; Vo-Van, Chi ; Coraux, Johann ; Zegenhagen, Joerg ; Busse, Carsten Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study // Physical review. B, Condensed matter and materials physics, 89 (2014), 15; 155427, 8. doi: 10.1103/PhysRevB.89.155427

Podaci o odgovornosti

Runte, Sven ; Lazić, Predrag ; Vo-Van, Chi ; Coraux, Johann ; Zegenhagen, Joerg ; Busse, Carsten

engleski

Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study

Graphene on Ir(111) is studied using scanning tunneling microscopy (STM) and x-ray standing waves (XSW). The graphene layer has a corrugated shape due to the moire pattern formed as a result of a spatially varying interaction strength between graphene and its substrate. The coherent fraction F-(111) determined in XSW allows us to determine the amplitude of this intrinsic corrugation when the incoherent contributions of wrinkles, step edges, graphene edges, and contaminations are taken into account. The corrugation is found to depend on the stress state of the carbon sheet. Using density functional theory (DFT) calculations, we show that graphene can compensate stress by increasing its corrugation rather than by a reduction of the C-C bond length.

epitaxial graphene ; photoelectron-spectroscopy ; ir(111) ; strain ; chemisorption ; intercalation ; iridium ; metals ; edges

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Podaci o izdanju

89 (15)

2014.

155427

8

objavljeno

1098-0121

1550-235X

10.1103/PhysRevB.89.155427

Povezanost rada

Fizika

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