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izvor podataka: crosbi

Wafer fusion : materials issues and device results (CROSBI ID 240933)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Black, A. ; Hawkins, A.R. ; Margalit, N.M. ; Babić, Dubravko I. ; Holmes, A.L. ; Chang, Y.-L. ; Abraham, P. ; Bowers, J.E. ; Hu, E.L. Wafer fusion : materials issues and device results // Ieee journal of selected topics in quantum electronics, 3 (1997), 3; 943-951. doi: 10.1109/2944.640648

Podaci o odgovornosti

Black, A. ; Hawkins, A.R. ; Margalit, N.M. ; Babić, Dubravko I. ; Holmes, A.L. ; Chang, Y.-L. ; Abraham, P. ; Bowers, J.E. ; Hu, E.L.

engleski

Wafer fusion : materials issues and device results

A large number of novel devices have been recently demonstrated using wafer fusion to integrate materials with different lattice constants. In many cases, devices created using this technique have shown dramatic improvements over those which maintain a single lattice constant. We present device results and characterizations of the fused interface between several groups of materials.

Semiconductor materials, Optical materials, Conducting materials, Wafer bonding, Lattices, Thermal resistance, Mirrors, Substrates, Wavelength division multiplexing, Semiconductor devices

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Podaci o izdanju

3 (3)

1997.

943-951

objavljeno

1077-260X

10.1109/2944.640648

Povezanost rada

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