GaN-HEMT Epilayers on Diamond Substrates: Recent Progress (CROSBI ID 650486)
Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Francis, D. ; Wasserbauer, J. ; Faili, F. ; Babić, Dubravko I. ; Ejeckam, F. ; Hong, W. ; Specht, P. ; Weber, E.
engleski
GaN-HEMT Epilayers on Diamond Substrates: Recent Progress
Gallium-nitride high-electron-mobility transistors fabricated on diamond substrates are highly desired for use in high-power amplifiers for XBand radar systems and commercial cellular-base stations. Diamond substrates have high thermal conductivity which enables highly efficient removal of heat from the active device regions. This paper describes our progress towards manufacturability of commercial-grade galliumnitride-transistor epilayers on diamond substrates. We report on the fabrication of the thickest (100 μm) and largest (4”) GaN-onDiamond composite wafers to date and show selected material haracterization results.
Gallium nitride, diamond, high-electron mobility transistors, X-Band, power, thermal management
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Podaci o prilogu
2007.
objavljeno
Podaci o matičnoj publikaciji
Proceedings of the International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH). Session 7
Podaci o skupu
International Conference on Compound Semiconductor Manufacturing Technology
predavanje
14.05.2007-17.05.2007
Austin (TX), Sjedinjene Američke Države