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GaN-HEMT Epilayers on Diamond Substrates: Recent Progress (CROSBI ID 650486)

Prilog sa skupa u zborniku | izvorni znanstveni rad | međunarodna recenzija

Francis, D. ; Wasserbauer, J. ; Faili, F. ; Babić, Dubravko I. ; Ejeckam, F. ; Hong, W. ; Specht, P. ; Weber, E. GaN-HEMT Epilayers on Diamond Substrates: Recent Progress // Proceedings of the International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH). Session 7. 2007

Podaci o odgovornosti

Francis, D. ; Wasserbauer, J. ; Faili, F. ; Babić, Dubravko I. ; Ejeckam, F. ; Hong, W. ; Specht, P. ; Weber, E.

engleski

GaN-HEMT Epilayers on Diamond Substrates: Recent Progress

Gallium-nitride high-electron-mobility transistors fabricated on diamond substrates are highly desired for use in high-power amplifiers for XBand radar systems and commercial cellular-base stations. Diamond substrates have high thermal conductivity which enables highly efficient removal of heat from the active device regions. This paper describes our progress towards manufacturability of commercial-grade galliumnitride-transistor epilayers on diamond substrates. We report on the fabrication of the thickest (100 μm) and largest (4”) GaN-onDiamond composite wafers to date and show selected material haracterization results.

Gallium nitride, diamond, high-electron mobility transistors, X-Band, power, thermal management

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Podaci o prilogu

2007.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of the International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH). Session 7

Podaci o skupu

International Conference on Compound Semiconductor Manufacturing Technology

predavanje

14.05.2007-17.05.2007

Austin (TX), Sjedinjene Američke Države

Povezanost rada

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