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Measurement of Thermal Boundary Resistance using Liquid Crystal Thermography

Liquid Crystal Thermography (LCT) is commonly used for hotspot identification and peak- temperature measurement in electronic devices. We use LCT to characterize GaN/Si and GaN/SiC high-electron mobility transistors and extract the thermal boundary resistance between the GaN epilayers and the substrate on these transistors.

Temperature measurement, Thermal resistance, Gallium nitride, Liquid crystals, Electrical resistance measurement, Substrates

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