engleski

Grazing-incidence small-angle X-ray scattering and reflectivity on nanostructured oxide films

Titanium dioxide, cerium dioxide, new Ce/Sn oxide films, vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel process. The morphology and phase transitions of these nanostructured and porous films was studied by grazing-incidence small-angle X-ray scattering (GISAXS) at the ELETTRA synchrotron (Italy, Trieste). Beside technological value of determining morphology of these films, a fundamental issue of origin of forming crystalline nano-particles from amorphous phase is tackled by observing amorphous interphase in structural phase transition anatase-rutile and transition amorphous-crystalline in vanadium oxide. The average grain radius <R> obtained by GISAXS varied with the annealing temperature, atmospheres (H2, O2 and N2), the number of dips and the layer thickness. Layer structure in V/Ce oxides was revealed by grazing-incidence X-ray reflectivity (GIXR) method. The average grain radius <R>, obtained by GISAXS was correlated with layer thickness. The specific surface area of these films was also determined and generally varied from 0.1 to 4 nm-1.

Thin films; sol-gel; nanostructure; GISAXS; GIXR

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