engleski

WDX-PIXE analysis of low energy X-rays using a microbeam

A high-energy resolution PIXE system developed at a heavy ion microbeam line was used to analyze low energy X-rays below 1 KeV. The system is equipped with a plane crystal spectrometer with a gas flow position sensitive proportional counter (PSPC), which enables high-energy resolution PIXE analysis using a microbeam. In order to improve the detection efficiency for the low energy X-rays, the X-ray entrance window of the PSPC was replaced with a thin polymer film supported by a metal grid. As the result, the detectable energy range was extended to carbon K X-rays and chemical effect in Fe and Cu L X-rays could be detected. A preliminary result of high energy resolution PIXE mapping of Cu mesh showed that it is possible to obtain the Cu Lalpha mapping image using a 2 MeV proton microbeam with the size of 20x20 micro m.

resolution pixe; spectra

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