engleski

The measurements of particle/crystallite size in naostructured TiO2 films by SAXS/WAXD method

Films of nanostructured TiO2 on glass substrates, prepared and annealed by different procedures were examuned by small-angle X-ray scattering and wide-angle X-ray diffraction. Insight into their structure is given by analysis of the coorrelation between the average particle size and the average crystallite size during the thermal evolution of the films.

Titanium dioxide; Film; Small-angle X-ray scattering; Wide-angle X-ray diffraction

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