engleski

Lumped Elements De-embedding Procedure

This paper discusses the de-embedding procedure used to subtract the pad parasitics from the on-chip measurements. The pad parasitics can be successfully modeled by lumped elements that surround the measured device. In order to use the suggested method it is necessary to have three standards: open, thru, and short standards. The proposed scheme takes into account the difference between the layouts of the de-embedding standards and measured devices. The de-embedding procedure is demonstrated on the on-chip inductor measurements.

de-embedding; lumped elements; pad parasitics

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