engleski

On the Accuracy of the Statistical Data Analysis in Optoelectronic Time Jitter Testing

The accuracy of parameters determined from the statistical approach to experimental data has been analysed. Two main procedures for estimating parameters of random variable are discussed. The confidence interval method includes the probability that the result falls within that interval. Another approach uses sample values as estimators for parameters of random variable. The results of statistical data analysis have been used in the optoelectronic time jitter testing, to improve the accuracy of nanosecond time interval measurements in the time-of-flight measuring system. That obtained the single-shot time resolution of 40 ps.

statistical; data analysis; time; jitter; optoelectronic

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