engleski

Characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide

Thin films of vanadium oxide and new, mixed V/Ce-oxide thin films with 55 and 38 at. % of V were prepared on glass substrates covered with SnO2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy (TEM) and grazing-incidence small-angle X-ray scattering (GISAXS). TEM revealed the crystalline structure, with the formation of V2O5 (orthorhombic structure) in all the films. The average grain radius <R>, obtained by (GISAXS), was correlated within the layer thickness.

Nano; V2O5; Mixed V/Ce Oxide; Films; Structural analysis; GISAX; TEM

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