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Electrical Conductivity of Nanostructured TiO2 Films on Glass Substrate Measured by Impedance Spectroscopy (CROSBI ID 497120)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Turković, Aleksandra ; Gaberšček, Miran ; Crnjak Orel, Zorica Electrical Conductivity of Nanostructured TiO2 Films on Glass Substrate Measured by Impedance Spectroscopy // 16th International Vacuum Congress : Book of abstracts. Vol.2 : Poster Sessions ; IVC-16, ICSS-12, NANO-8, AIV-17 / Borello, G.P. ; Campani, M. (ur.). Venecija: RedHat Linux, 2004. str. 398-398

Podaci o odgovornosti

Turković, Aleksandra ; Gaberšček, Miran ; Crnjak Orel, Zorica

engleski

Electrical Conductivity of Nanostructured TiO2 Films on Glass Substrate Measured by Impedance Spectroscopy

Films containing nanosized grains of titanium dioxide (TiO2) are widely used in research into mainly optical, photovoltaic, photochromic and electrochromic devices. In most cases there is a desirable average grain size, but also a porosity of TiO2. Films of titanium dioxide derived by organic sol-gel route were investigated by transmission electron microscopy. It shows them as polydispersed and porous, with nanometer sized grains. Measurements by grazing-incidence small-angle X-ray scattering (GISAXS) showed that grain sizes vary with the thickness of the films. In order to determine electrical properties of nano-TiO2 films, samples were characterised by impedance spectroscopy (IS). We have found the dependence of electrical conductivity upon the grain sizes in nanostructured films of TiO2. The experiment was done in the range of film˘s thickness from 200 Å to 1200 Å. Porosity for these films thickness is constant and expressed by internal specific surface equals Ss= 1 nm-1.

titanium dioxide; GISAXS; IS

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Podaci o prilogu

398-398.

2004.

objavljeno

Podaci o matičnoj publikaciji

16th International Vacuum Congress : Book of abstracts. Vol.2 : Poster Sessions ; IVC-16, ICSS-12, NANO-8, AIV-17

Borello, G.P. ; Campani, M.

Venecija: RedHat Linux

Podaci o skupu

International Vacuum Congress (16 ; 2004)

poster

28.06.2004-02.07.2004

Venecija, Italija

Povezanost rada

Fizika