IBIC study of charge collection properties in Si(Li) detectors (CROSBI ID 81077)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Jakšić, Milko ; Fazinić, Stjepko ; Tadić, Tonči ; Bogovac, Mladen ; Bogdanović, Ivančica ; Pastuović, Željko
engleski
IBIC study of charge collection properties in Si(Li) detectors
The nuclear microprobe technique ion beam induced charge (IBIC) has been used to probe the charge collection efficiency across the front surface of Si(Li) X-ray detectors. IBIC was performed using 2.667 MeV ^6Li ions, avoiding the large penetration depth of the conventional proton-IBIC. The front surfaces of two Si(Li) detectors were scanned to image inhomogeneities of incomplete charge collection (ICC). The relationship between the X-ray peak shape of the tested detectors and the degree of incomplete charge collection is discussed.
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Podaci o izdanju
138
1998.
1327-1332-x
objavljeno
0168-583X