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Structural studies of nanocrystalline Sb-doped SnO_2 (CROSBI ID 31249)

Prilog u knjizi | izvorni znanstveni rad

Gržeta, Biserka ; Tkalčec, Emilija ; Goebbert, Christian ; Takeda, Masuo ; Takahashi, Masashi ; Nomura, Kiyoshi Structural studies of nanocrystalline Sb-doped SnO_2 // Cristalografía: Fundamentos Técnicas y Aplicaciones / Bucio, Lauro (ur.). Mexico City: Sociedad Mexicana de Cristalografia, 2005. str. 69-74

Podaci o odgovornosti

Gržeta, Biserka ; Tkalčec, Emilija ; Goebbert, Christian ; Takeda, Masuo ; Takahashi, Masashi ; Nomura, Kiyoshi

engleski

Structural studies of nanocrystalline Sb-doped SnO_2

Antimony-doped tin oxide (ATO) samples with doping level up to 14 at% Sb were hydrothermally prepared and characterized by X-ray powder diffraction as well with ^(121)Sb Mössbauer spectroscopy. The prepared samples were nanocrystalline. Diffraction lines were broadened, the line broadening being anisotropic. The Sb-doping level influenced both the line broadening and the line widths anisotropy. All samples were tetragonal, space group P42/mnm and isostructural with TiO_2 (rutile). Unit-cell parameters increased with Sb content. Crystal structure indicated that both Sb^(3+) and Sb^(5+) are substituted for Sn^(4+) in the SnO_2 structure, Sb^(3+) being dominant for the as-prepared samples. Mössbauer spectroscopy confirmed the XRD results. The sample containing 6.2 at% Sb was additionally annealed at 350, 450 and 550 oC for 1 h. Broadening of diffraction lines increased due to annealing at 350 oC, then decreased upon further heating. The line anisotropy decreased over the whole temperature range. Unit-cell parameters of the annealed sample decreased with the increase in thermal treatment temperature, which suggested that oxidation of Sb^(3+) took place in an-nealing process. Mössbauer spectroscopy showed that Sb^(3+)/Sb^(5+) content ratio decreased upon annealing. It was noticed that the ratio of full-widths at half-maximum (FWHM) for the diffraction lines 110 and 101 is a good indicator of the Sb^(3+)/Sb^(5+) content ratio in the samples.

Sb-doped tin oxyde ; X-ray diffraction ; Moessbauer spectroscopy

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Podaci o prilogu

69-74.

objavljeno

Podaci o knjizi

Cristalografía: Fundamentos Técnicas y Aplicaciones

Bucio, Lauro

Mexico City: Sociedad Mexicana de Cristalografia

2005.

970-9888-07-2

Povezanost rada

Fizika, Kemija, Kemijsko inženjerstvo