Current filamentation and degradation in electronic devices based on amorphous organic layers (CROSBI ID 117924)
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Tutiš, Eduard ; Batistić, Ivo
engleski
Current filamentation and degradation in electronic devices based on amorphous organic layers
The recent advent of new flat-panel organic displays follows a long struggle for extended device lifetime. Many modifications proposed along this way have been based on trial and error experimentation. In this paper we show that some recent major improvements may have been implicitly related to fighting against the strong current filamentation, intrinsic for charge injection and conduction in organic amorphous thin films. We first recapitulate some major causes for current filamentation in thin amorphous organic layers. Then we consider the charge transport in devices with a high mobility injection layer, with a smoothened organic heterojunction surface, those operating at lower electric fields, and devices with doped transport layers. We show that all these conditions, known to decrease device degradation rates, may separately lead to the current homogenization in organic films.
organic ; molecular ; diode ; multilayer ; heterojunction ; ageing ; degradation ; light emitting ; chaneling
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