Crystallization Kinetics of Amorphous AlW Thin Films Studied By Electrical Resistivity (CROSBI ID 468921)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija
Podaci o odgovornosti
Car, Tihomir ; Radić, Nikola ; Ivkov, Jovica ; Tonejc, Antun
engleski
Crystallization Kinetics of Amorphous AlW Thin Films Studied By Electrical Resistivity
Crystallization of the amorphous Al-W thin films, obtained by co-evaporation on different supports, are being extensively studied using suitable annealing procedures. The amorphous -to-crystalline transformation was monitored by thermal, structural and electrical measurements. The structural changes and phases were identified by X-ray difraction and high resolution transmission electron microscopy. The influence of different kind of supports on other experimental conditions on the structure of as-co-evaporated thin films was also examined
Amorphous Thin Films; Al-W; Crystallization
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Podaci o prilogu
345-x.
1998.
objavljeno
Podaci o matičnoj publikaciji
Abstract Books
Ono, M.
Birmingham: International Convention Centre
Podaci o skupu
14th International Vacuum Congress
poster
01.01.1998-01.01.1998
Birmingham, Ujedinjeno Kraljevstvo