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Crystallization Kinetics of Amorphous AlW Thin Films Studied By Electrical Resistivity (CROSBI ID 468921)

Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | međunarodna recenzija

Car, Tihomir ; Radić, Nikola ; Ivkov, Jovica ; Tonejc, Antun Crystallization Kinetics of Amorphous AlW Thin Films Studied By Electrical Resistivity // Abstract Books / Ono, M. (ur.). Birmingham: International Convention Centre, 1998. str. 345-x

Podaci o odgovornosti

Car, Tihomir ; Radić, Nikola ; Ivkov, Jovica ; Tonejc, Antun

engleski

Crystallization Kinetics of Amorphous AlW Thin Films Studied By Electrical Resistivity

Crystallization of the amorphous Al-W thin films, obtained by co-evaporation on different supports, are being extensively studied using suitable annealing procedures. The amorphous -to-crystalline transformation was monitored by thermal, structural and electrical measurements. The structural changes and phases were identified by X-ray difraction and high resolution transmission electron microscopy. The influence of different kind of supports on other experimental conditions on the structure of as-co-evaporated thin films was also examined

Amorphous Thin Films; Al-W; Crystallization

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Podaci o prilogu

345-x.

1998.

objavljeno

Podaci o matičnoj publikaciji

Abstract Books

Ono, M.

Birmingham: International Convention Centre

Podaci o skupu

14th International Vacuum Congress

poster

01.01.1998-01.01.1998

Birmingham, Ujedinjeno Kraljevstvo

Povezanost rada

Fizika