SPUTTER-DEPOSITED AMORPHOUS-LIKE TUNGSTEN (CROSBI ID 759371)
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Podaci o odgovornosti
Radić, Nikola ; Tonejc, Antun ; Ivkov, Jovica ; Dubček, Pavo ; Bernstorff, Sigrid ; Medunić, Zvonko
engleski
SPUTTER-DEPOSITED AMORPHOUS-LIKE TUNGSTEN
The sputter-deposited films tend to have high residual stress, which changes from strongly compressive to tensile with increasing working gas pressure. Simultaneously, phase composition of tungsten films changes from predominantly  -W form to  -W modification. The formation and stabilization of  -W in case of sputter-deposited tungsten films is attributed to the incorporation of oxygen in the film.
tungsten; sputtering; amorphous
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Podaci o izdanju
IBR Elettra Annual Report 2003 Austro SAXS
2004.
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