Low-temperature X-ray diffraction examination of In2Se3 (CROSBI ID 131303)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Gržeta, Biserka ; Popović, Stanko ; Cowlam, Neil ; Čelustka, Branko
engleski
Low-temperature X-ray diffraction examination of In2Se3
Indium selenide, In_2Se_3, has been examined by X-ray diffraction in the temperature interval from 300 to 5 K. Coefficients of thermal expansion for the rhombohedral alpha- In_2Se_3 phase in the low- temperature range have been determined and the appearance of the new phase at temperature below ~160 K was confirmed.
indium selenide ; thermal expansion at low temperature ; X-ray diffraction
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Podaci o izdanju
23
1990.
340-341
objavljeno
0021-8898
1600-5767
10.1107/S0021889890002710