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Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component (CROSBI ID 131310)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Gržeta, Biserka ; Popović, Stanko Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component // Journal of applied crystallography, 18 (1985), 80-84. doi: 10.1107/S0021889885009876

Podaci o odgovornosti

Gržeta, Biserka ; Popović, Stanko

engleski

Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component

A method is described for semiquantitative X.ray diffraction phase analysis, which involves the addition to the investigated multicomponent system of known large (about 80-95%) amounts of a crystalline substance originally not contained in the system. This results in a decrease of the diffraction line intensities of the components to be measured to small but detectable values. The wiight fraction of a component is related to the added fraction of the doping substance and to the fraction of the component remaining in the doped sample. The method is very simple and yields the weight fractions of the major components in the system with a typical error of a few percent. The weight fractions of the minor components cannot be determined with fair accuracy in this way. The method is appropriate in cases where only a small amount of the investigated system is available. Optimum conditions to attain maximum accuracy of the methodare discussesd.

X-ray diffraction ; quantitative phase analysis

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Podaci o izdanju

18

1985.

80-84

objavljeno

0021-8898

1600-5767

10.1107/S0021889885009876

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Fizika

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