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"Boson" peak in Raman spectra of hydrogenated amorphous silicon (CROSBI ID 133219)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Ivanda, Mile ; Furić, Krešimir ; Gamulin, Ozren ; Gracin, Davor "Boson" peak in Raman spectra of hydrogenated amorphous silicon // Journal of non-crystalline solids, 137-138 (1991), 1; 103-106. doi: 10.1016/S0022-3093(05)80067-5

Podaci o odgovornosti

Ivanda, Mile ; Furić, Krešimir ; Gamulin, Ozren ; Gracin, Davor

engleski

"Boson" peak in Raman spectra of hydrogenated amorphous silicon

Hydrogenated amorphous silicon films were prepared by a dc magnetron sputtering method. Broad bacground signal observed in Raman spectra near the excitation line which is recently attributed to the recombination of nonthermal electron with nonhermal holes was decomposed from the phonon bands. The Stokes/anti-Stokes ratio, depolarization ratio and the shape of the bacground signal have the characteristics typical for the non-continous structure of amorphous silicon, composed of the blobs of strongly conected silicon atoms placed around hydrogen clusters.

amorphous silicon ; Raman spectroscopy ; boson peak

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Podaci o izdanju

137-138 (1)

1991.

103-106

objavljeno

0022-3093

10.1016/S0022-3093(05)80067-5

Povezanost rada

Fizika

Poveznice
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