engleski

Characterization of crater after GDS experiment performed on TiAlN coatings

GDS is a rapid depth profiling technique. This analysis is destructive and there is a formation of sputter craters on the sample surface. In this work the depth profiling method GDS is used for determining the thickness of TiAlN coating after determining the sputtering rate as well as the crater microstructure. The GDS depth profiles were measured by means of spectrometer GDS 750, Leco. The obtained data were compared with the thickness values determined by the Kalotest technique and obtained from the SEM fracture cross-sections. Microstructure and shape of crater after GDS experiment at different coating depths were evaluated. The shape, roughness and crater depth were measured by means of Perthometer. The investigated coatings were deposited on tool steel AISI D2 of Uddeholm Company under the trade name Sverker 21 by cathode arc evaporation technique (BAI 1200) in Balzers (Kapfenberg, Austria).

TiAlN coating ; GDOES ; sputter crater

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