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Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties (CROSBI ID 133911)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Gajović, Andreja ; Gracin, Davor ; Djerdj, Igor ; Tomašić, Nenad ; Juraić, Krunoslav ; Su, Dang Sheng Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties // Applied surface science, 254 (2008), 9; 2748-2754. doi: 10.1016/j.apsusc.2007.10.014

Podaci o odgovornosti

Gajović, Andreja ; Gracin, Davor ; Djerdj, Igor ; Tomašić, Nenad ; Juraić, Krunoslav ; Su, Dang Sheng

engleski

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

A series of thin silicon films with different degrees of crystallinity were prepared by decomposition of silane gas highly diluted with hydrogen, in radiofrequency glow discharge. The crystallite size, shape, and the portion of crystalline phase were investigated by high-resolution transmission electron microscopy (HRTEM), selected-area electron diffraction (SAED), Raman spectroscopy (RS), and X-ray powder diffraction (XRD). The absorption coefficient ( ) was calculated from the measurement of UV-VIS-transmittance. By using RS, the volume fractions of the crystalline phase were estimated from the ratio of the integrated intensities of transversal optical (TO)-related crystalline and amorphous bands. These results were in excellent agreement with the mean crystallite sizes measured in HRTEM images and crystallite sizes refined from XRD measurements. The red shift of absorption, appearing as a result of the increase of the crystal fraction, depends on the size and distribution of nanocrystals.

silicon ; solar cells ; nanostructures ; optical properties

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Podaci o izdanju

254 (9)

2008.

2748-2754

objavljeno

0169-4332

10.1016/j.apsusc.2007.10.014

Povezanost rada

Fizika, Geologija

Poveznice
Indeksiranost