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Oxygen Non-Stoichiometry in Thermally Annealed and Hydrogen Implanted TiO2 Thin Films Observed by Raman Spectroscopy (CROSBI ID 532594)

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Turković, Aleksandra ; Ivanda, Mile ; Tudorić-Ghemo, Josip ; Godinović, Nikola ; Sorić, Ivica Oxygen Non-Stoichiometry in Thermally Annealed and Hydrogen Implanted TiO2 Thin Films Observed by Raman Spectroscopy // Proceedings of Symposium A 3 of the International Conference on Advanced Materials (ICAM 91) "Non-Stoichiometry in Semiconductors" / Bachmann, K.J. ; Hwang, H.-L. ; Schwab, C. (ur.). Amsterdam : London : New York (NY) : Tokyo: North-Holland, 1992. str. 307-313

Podaci o odgovornosti

Turković, Aleksandra ; Ivanda, Mile ; Tudorić-Ghemo, Josip ; Godinović, Nikola ; Sorić, Ivica

engleski

Oxygen Non-Stoichiometry in Thermally Annealed and Hydrogen Implanted TiO2 Thin Films Observed by Raman Spectroscopy

Oxygen non-stoichiometry has been induced into TiO2 thin films by two methods. The first one was performed by thermal annealing in non-oxydizing atmospheres (H2 and N2) and the second one by implantation of protons by the means of Van de Graff Machine (500 KeV). The thin film samples of TiO2 have been observed by Raman spectroscopy before and after post-deposition treatment and hydrogen implantation. The peak position and full width at half maximum for characteristical vibrational Raman modes have been analyzed.

Thin films; TiO2; Raman; implantation of protons

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Podaci o prilogu

307-313.

1992.

objavljeno

Podaci o matičnoj publikaciji

Proceedings of Symposium A 3 of the International Conference on Advanced Materials (ICAM 91) "Non-Stoichiometry in Semiconductors"

Bachmann, K.J. ; Hwang, H.-L. ; Schwab, C.

Amsterdam : London : New York (NY) : Tokyo: North-Holland

0-444-89355-5

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Nepoznat skup

poster

29.02.1904-29.02.2096

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Fizika