engleski

Analysis of conducted electromagnetic emissions in integrated circuits

Design of integrated circuits (IC) is a very complex task. One of the most critical steps in the design process is the estimation of electromagnetic compatibility (EMC) of the designed circuit. Electronic equipment has to comply with electromagnetic compatibility standards and integrated circuits are most often the root cause of disturbances in electronic systems. The standards regarding conducted EME (Electromagnetic Emission) and EMI (Electromagnetic Immunity) are measured and simulated as the first step towards achieving EM compatibility. Models suitable for simulations of EM emissions and immunity are developed and their accuracy is assessed. An EMC aware design procedure and effective circuit optimization strategy are demonstrated. An EMC test chip is designed in submicron CMOS technology, processed, measured and the measurement results are compared with simulations in order to demonstrate the validity and accuracy of models and procedures described in this thesis.

design; integrated circuits; electromagnetic compatibility; electromagnetic emissions; electromagnetic immunity

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