Growth and Electronic properties of ultra-thin Ag films (CROSBI ID 143275)
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Mikšić Trontl, Vesna ; Pervan, Petar ; Milun, Milorad
engleski
Growth and Electronic properties of ultra-thin Ag films
We present experimental study of the growth mode and electronic properties of ultra-thin silver films deposited on Ni(111) surface by means of scanning tunnelling microscopy (STM) and high resolution angle resolved photoemission spectroscopy (HR-ARPES). The formation of the 4d-quantum well states (QWS) was found in agreement with the Stranski-Krastanow growth mode of Ag(111). The electronic structure of the 1 ML film is consistent with the silver layer which very weakly interacts with the supporting surface. The analysis of the lineshape of Ag-4d QW states suggests strong localization of the electronic states within the silver layer but at the same time the decay of the photo-hole appears to be influenced by the dynamics of the electrons in the supporting surface.
ultra thin films; epitaxy; silver; nickel; angle resolved photoemission; scanning tunneling microscopy; quantum wells
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