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Growth and Electronic properties of ultra-thin Ag films (CROSBI ID 143275)

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Mikšić Trontl, Vesna ; Pervan, Petar ; Milun, Milorad Growth and Electronic properties of ultra-thin Ag films // Surface science, 603 (2009), 1; 125-130. doi: 10.1016/j.susc.2008.10.044

Podaci o odgovornosti

Mikšić Trontl, Vesna ; Pervan, Petar ; Milun, Milorad

engleski

Growth and Electronic properties of ultra-thin Ag films

We present experimental study of the growth mode and electronic properties of ultra-thin silver films deposited on Ni(111) surface by means of scanning tunnelling microscopy (STM) and high resolution angle resolved photoemission spectroscopy (HR-ARPES). The formation of the 4d-quantum well states (QWS) was found in agreement with the Stranski-Krastanow growth mode of Ag(111). The electronic structure of the 1 ML film is consistent with the silver layer which very weakly interacts with the supporting surface. The analysis of the lineshape of Ag-4d QW states suggests strong localization of the electronic states within the silver layer but at the same time the decay of the photo-hole appears to be influenced by the dynamics of the electrons in the supporting surface.

ultra thin films; epitaxy; silver; nickel; angle resolved photoemission; scanning tunneling microscopy; quantum wells

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Podaci o izdanju

603 (1)

2009.

125-130

objavljeno

0039-6028

10.1016/j.susc.2008.10.044

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Fizika

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