engleski

STRUCTURE OF SAMPLES OF CONTROLLABLY DOPED POLYANILINE, AND ITS INFLUENCE ON ELECTRICAL CONDUCTIVITY AT LOW TEMPERATURES

We used x-ray diffraction to investigate the structure of controllably doped samples of polyaniline. The diffraction was performed with x-ray diffractometer for powder samples of the type "Philips PW 1820". This diffractometer has no film, but it uses radiation detectors and automatically stores data in a digital format. The used wave length of the x-ray radiation was 0, 1542 nm, which corresponds to the characteristic radiation line of Copper K. On the basis of the dependence of the x-ray diffraction intensity from the scattering angle, it can be clearly observed how the doping and the structure of samples influence the electrical conductivity of polyaniline.

polymers; polyaniline; doping; structure; x-ray diffraction; conductivity; crystal areas

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