Spectrum modelling and influence on chemical state analysis using WDS-PIXE system (CROSBI ID 543929)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Mandić, Luka ; Fazinić, Stjepko ; Jakšić, Milko ; Dobrinić, Julijan
engleski
Spectrum modelling and influence on chemical state analysis using WDS-PIXE system
The Tandem accelerator facility of the Ruđer Bošković Institute is equipped with high resolution wavelength dispersive spectrometer system (WDS) used for chemical state analysis by PIXE method. In our recently performed analysis of vanadium and titanium samples, the most important conclusions are derived from relative intensities and energies of the Kβ 5 and Kβ '' X-ray lines extracted from fitted Kβ spectra [1]. In some cases results of analysis are very sensitive on the fitting procedures, especially on how they handle absorption K edge feature. In this work we report the influence of fit models on analysis of spectra and final interpretation of chemical states.
spectrum modelling ; WDS-PIXE system
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Podaci o prilogu
237-x.
2008.
objavljeno
Podaci o matičnoj publikaciji
Book of Abstracts
Fazinić, S. ; Jakšić, M.
Zagreb: Institut Ruđer Bošković
Podaci o skupu
European Conference on X-Ray Spectrometry
poster
16.06.2008-20.06.2008
Dubrovnik, Hrvatska; Cavtat, Hrvatska