engleski

X-ray tracing study of crystall spectrometers for WDXRS application

Construction of wavelength-dispersive crystal X-ray spectrometer, used in high resolution wavelength dispersion X-ray emission spectroscopy (WDXRS), may result in geometrical aberrations, such are systematic X-ray line shifts and changes of the X-ray line shape. Most of these aberrations can be reduced by a careful design of a crystal spectrometer, maintaining efficiency of the spectrometer as high as possible. Since experimental investigation of impact of WDX spectrometer design on aberrations is difficult, a numerical X-ray tracing procedure has been applied for this purpose, with output in the form of a 2-dimensional virtual X-ray intensity array on the detector surface or in the form of virtual X-ray energy spectrum.

X-ray tracing study; WDXRS

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