Small angle X-ray scattering and X-ray reflection on thin films (CROSBI ID 472574)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa | domaća recenzija
Podaci o odgovornosti
Dubček, Pavo ; Milat, Ognjen ; Lučić-Lavčević, Magdi ; Turković, Aleksandra ; Etlinger, Božidar ; Amenitsch, Heinz
engleski
Small angle X-ray scattering and X-ray reflection on thin films
Small angle X-ray scattering (SAXS) on thin films in standard sample orientation ( primary beam passes through the substrate before entering the film) yields a very weak signal due to unfavorable film to substrate thickness ratio.
SAXS; thin films
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Podaci o prilogu
57-x.
1997.
objavljeno
Podaci o matičnoj publikaciji
Zagreb: Hrvatska kristalografska zajednica HAZU
Podaci o skupu
Sixth Croatian-Slovenian Crystallographic meeting
predavanje
19.06.1997-21.06.1997
Umag, Hrvatska
