engleski

Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films

Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel dip-coating process. The average grain radius <R>, obtained by grazing-incidence small-angle X-ray scattering (GISAXS) for pure V2O5 was 7, 49+-1.06 nm. The average grain size <R> for mixed oxides depends on the atomic percent of V in the sample. The fractal nature of some of these samples is analyzed.

small-angle scattering X-ray; nanocrystalline-materials-structure; GISAXS; thin films; V/Ce oxide; dip-coating

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