izvor podataka: crosbi
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X-ray diffraction examination of structure and stability of amorphous Cu--W thin films (CROSBI ID 161337)
Prilog u časopisu | izvorni znanstveni rad
Gržeta, Biserka ; Radić, Nikola ; Gracin, Davor ; Došlić, Tomislav
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films // Materials science forum, 133-136 (1993), 913-919
Podaci o odgovornosti
Gržeta, Biserka ; Radić, Nikola ; Gracin, Davor ; Došlić, Tomislav
engleski
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films
Detailed studies of the structure of the amorphous Cu - W thin films deposited by magnetron sputtering have been performed by X-ray diffraction at 300 K.
amorphous alloys; thin films
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