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High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials (CROSBI ID 88319)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Tonejc, Anđelka High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials // Acta chimica slovenica, 46 (1999), 3; 435-461-x

Podaci o odgovornosti

Tonejc, Anđelka

engleski

High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials

A brief overview of the application of the high resolution transmision electron microscopy (HRTEM) method is given: the principle of HRTEM image formation in an electrone microscope; different modes of image formation; the role of the contrast transfer function in HRTEM image formation; definition and improvement of electron microscope resolution. In theis work the results obtained by applying the CRISP program to analyse the HRTEM photopgraphs of mechanically allyed nanocrystalline materials are presented.

HRTEM; image processing; nanocrystalline materials

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Podaci o izdanju

46 (3)

1999.

435-461-x

objavljeno

1318-0207

Povezanost rada

Fizika

Indeksiranost