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Collector Region Design and Optimization in Horizontal Current Bipolar Transistor (HCBT)

Three different types of the n-collector region of Horizontal Current Bipolar Transistor (HCBT) are analyzed and compared. The optimum n-collector profile suppresses the charge sharing effect between the intrinsic and extrinsic base regions, resulting in the uniform base width and electric field in the intrinsic transistor. This implies a maximum BVCEO and an optimum fTBVCEO product among compared structures. The HCBT with a selectively implanted collector (SIC) is introduced and examined. It reduces RC and increases fT comparing to the other n-collector designs. The analyses give the guidelines for the optimum HCBT design for targeted applications.

BiCMOS integrated circuits; Bipolar transistors; HF radio communication; Horizontal Current Bipolar Transistor

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