engleski

An x-ray diffraction study of the sytem Al-In-S

The first data of investigation of partial replacement in In with Al were reported by Etlinger, who prepared Al2In12S21 and studied some of its physical properties (15). Afterwards a systematic study of the system (AlxIn1-x)2S3 has been undertaken, with x changing from 0 to 1/3. The first results are given in the present communication. Seven compounds with x = 0, 1/13, 1/11, 1/9, 1/7, 1/5, and 1/3 were prepared by modified SSD method (16). The compound were investigated by x-ray diffraction, using a counter diffract meter with monochromatized CuK(alfa) radiation.

X-ray diffraction ; system Al-In-S

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