engleski

X-ray diffraction study of the systems Cu(GaxIn(1-x))Te2 and CuGa(SexTe(1-x))2

Series of solid solutions in the systems Cu(GaxIn(1-x))Te2 and CuGa(SexTe(1-x))2, x between 0 and 1, were prepared by direct synthesis from the melt in evacuated and sealed silica tubes using high-purity components. The powdered samples were examined by X-ray diffraction, using a counter diffractometer with CuK(alfa) radiation. It has been found that for both systems in the whole range of concentrations a chalcopyrite-type structure is present. The unit cell parameters a and c and the ratio c/a change linearly with x.

diffraction; chalcopyrite; solid solution; Cu-Ga-In-Te; Cu-Ga-Se-Te

Godišnjak Jugoslavenskog centra za kristalografiju, vol. 18, I-IV, 1-80, Zagreb, 1983., YU ISSN 0351-3262, UDC 548, pod naslovom Izvještaj Jugoslavenskog centra za kristalografiju