engleski

Integration of PIXE and XRF spectrometries for simultaneous applications

Particle induced X-ray emission (PIXE) and X-ray fluorescence (XRF) analysis both offer high analytical potential for multi-elemental investigations and material characterization. In this work unification of the two methods is investigated and the results are discussed. Integration of the techniques into one setup and their combined use exploits the complementarities of the two methods, and by broadening the sensitivity for low and high Z elements it allows even more precise elemental characterization of a sample under investigation. Furthermore, by mounting an X-ray source within a PIXE chamber, and using the existing PIXE detection system, positioning mechanism and electronics, a fully operational XRF system is acquired without much further investment. This allows easy and fast preliminary XRF screening and bulk analysis of the samples prior to a PIXE measurement, or simply provides an alternative technique when ion beam from the accelerator is not available. Additionally, this setup could be useful for investigating the effects of combined PIXE and XRF sample excitation.

XRF; PIXE; method integration

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