engleski

The metallographic analysis of iron sulfide thin films which have been obtained using high-speed evaporation method

The implementation of the method made possible to obtain the films of cathode material up t0 20 μm thickness with good adhesion properties. The thin film phase analysis differs from initial material one: the interference lines corresponded to pyrite and low temperature piritinite of α and γ iron modifications are identified. The phase crystalline structure constituent has been determined using Sheerer equation and equals 10-20 nm.

metallographic analysis; iron sulfide thin films

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