engleski

Susceptibility of integrated circuits to electromagnetic interference

This thesis includes measurements and simulations to investigate the susceptibility of integrated circuits to conducted electromagnetic interference. Measurements are carried out according to direct power injection method (DPI). The investigation is focused on several basic circuits which are common in automotive industry: low and high voltage PMOS transistors, AB buffer, bandgap circuit and voltage regulator. Furthermore, this thesis explains analytically and experimentally the underlining effects caused by conducted electromagnetic interference and presents extraction methods to improve simulation models to achieve better susceptibility predictions. Additionally, simple but effective measures to increase the immunity of the circuits are presented.

direct power injection; electromagnetic interference; integrated circuits; smart power technology

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