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Electron ionisation induced fragmentation of fused norbornene analogues containing SiMe2 or GeMe2 and oxygen bridges. Migration of SiMe2 and GeMe2 groups

The main electron impact induced fragmentation processes of fused norbornene analogues containing SiMe_2 and GeMe_2 and oxygen bridges, as well as their dependence on substitution were investigated using mass and MIKE spectra. Formation of the rearrangement ions of m/z 176 in the mass spectra of fused norbornene analogues containing SiMe_2 and m/z 222 in the mass spectrum of norbornene analogue containing GeMe_2 provides a firm evidence for the migration of SiMe_2 and GeMe_2 bridge, respectively.

electron ionisation ; norbornene analogues ; SiMe2 ; GeMe2 ; oxygen bridges

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