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izvor podataka: crosbi

Ion beam induced charge collection time imaging of a silicon microdosimeter (CROSBI ID 196008)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Cornelius, I.M. ; Orlić, Ivica ; Siegele, R. ; Rosenfeld, A.B. ; Cohen, D.D. Ion beam induced charge collection time imaging of a silicon microdosimeter // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 210 (2003), 191-195. doi: 10.1016/S0168-583X(03)01068-1

Podaci o odgovornosti

Cornelius, I.M. ; Orlić, Ivica ; Siegele, R. ; Rosenfeld, A.B. ; Cohen, D.D.

engleski

Ion beam induced charge collection time imaging of a silicon microdosimeter

The timing properties of a silicon-on-insulator microdosimeter for medical and space applications have been studied using an ion microprobe. These measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.

microprobe; microdosimetry; pulse shape discrimination

Rad je prezentiran na skupu 8th International Conference of Nuclear Microprobe Technology and Applications, održanom od 08.-13.09.2002.g., Takasaki, Japan.

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Podaci o izdanju

210

2003.

191-195

objavljeno

0168-583X

10.1016/S0168-583X(03)01068-1

Povezanost rada

Fizika

Poveznice
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