Ion beam induced charge collection time imaging of a silicon microdosimeter (CROSBI ID 196008)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Cornelius, I.M. ; Orlić, Ivica ; Siegele, R. ; Rosenfeld, A.B. ; Cohen, D.D.
engleski
Ion beam induced charge collection time imaging of a silicon microdosimeter
The timing properties of a silicon-on-insulator microdosimeter for medical and space applications have been studied using an ion microprobe. These measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.
microprobe; microdosimetry; pulse shape discrimination
Rad je prezentiran na skupu 8th International Conference of Nuclear Microprobe Technology and Applications, održanom od 08.-13.09.2002.g., Takasaki, Japan.
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Podaci o izdanju
210
2003.
191-195
objavljeno
0168-583X
10.1016/S0168-583X(03)01068-1