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Nuclear microscopy of single aerosol particle (CROSBI ID 196014)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Orlić, Ivica ; Watt, F. ; Loh, K.K. ; Tang, S.M. Nuclear microscopy of single aerosol particle // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85 (1994), 1-4; 840-844. doi: 10.1016/0168-583X(94)95934-X

Podaci o odgovornosti

Orlić, Ivica ; Watt, F. ; Loh, K.K. ; Tang, S.M.

engleski

Nuclear microscopy of single aerosol particle

The Nuclear Microscope at the National University of Singapore is being used for the analysis of single aerosol particles. The methodology of utilizing off-axis Scanning Transmission Ion Microscopy (STIM) to identify and characterize the size and shape of the particles, Rutherford backscattering (RBS) to determine the matrix composition and effective thickness, and Particle Induced X-ray Emission (PIXE) to determine the minor and trace elements to the ppm level, is presented. Thin film pioloform substrates are found to be the most suitable backing material for the single particle analysis.

nuclear microscopy ; STIM ; RBS ; PIXE

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Podaci o izdanju

85 (1-4)

1994.

840-844

objavljeno

0168-583X

1872-9584

10.1016/0168-583X(94)95934-X

Povezanost rada

Fizika

Poveznice