Nuclear microscopy of single aerosol particle (CROSBI ID 196014)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Orlić, Ivica ; Watt, F. ; Loh, K.K. ; Tang, S.M.
engleski
Nuclear microscopy of single aerosol particle
The Nuclear Microscope at the National University of Singapore is being used for the analysis of single aerosol particles. The methodology of utilizing off-axis Scanning Transmission Ion Microscopy (STIM) to identify and characterize the size and shape of the particles, Rutherford backscattering (RBS) to determine the matrix composition and effective thickness, and Particle Induced X-ray Emission (PIXE) to determine the minor and trace elements to the ppm level, is presented. Thin film pioloform substrates are found to be the most suitable backing material for the single particle analysis.
nuclear microscopy ; STIM ; RBS ; PIXE
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Podaci o izdanju
85 (1-4)
1994.
840-844
objavljeno
0168-583X
1872-9584
10.1016/0168-583X(94)95934-X