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Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods (CROSBI ID 197202)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Sandrik, R. ; Jergel, M. ; Strbik, V. ; Nakamura, K. ; Ishii, A. ; Orlić, Ivica ; Tang, S.M. ; Watt, F. Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118 (1996), 1-4; 602-607. doi: 10.1016/0168-583X(95)01078-5

Podaci o odgovornosti

Sandrik, R. ; Jergel, M. ; Strbik, V. ; Nakamura, K. ; Ishii, A. ; Orlić, Ivica ; Tang, S.M. ; Watt, F.

engleski

Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods

Lateral inhomogeneity has been studied in thin films of YBa2Cu3O7 − δ deposited from aerosol on MgO substrates. RBS and PIXE analyses distinguished areas that were found to differ in the critical temperature Tc values. The PIXE results confirmed the differences in composition between those areas. Variations in layer thicknesses were found by means of RBS analysis. Measurements made with a microbeam showed that the film within each of those areas was homogeneous. However, significant variations in the YBaCuO stoichiometry and local changes in the film thickness were found in the intermediate zone between areas with Tc = 85 K and Tc = 80 K.

RBS ; PIXE ; thin film YBa2Cu3O7 − δ

Rad je prezentiran na skupu Ion Beam Analysis, održanom od 22.–26.05.1995.g., Tempe, Arizona, SAD ; R.J. Culbertson (ur.).

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Podaci o izdanju

118 (1-4)

1996.

602-607

objavljeno

0168-583X

1872-9584

10.1016/0168-583X(95)01078-5

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