Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility (CROSBI ID 206545)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Tadić, Tonči ; Bogdanović Radović, Ivančica ; Siketić, Zdravko ; Cosica, Donny Domagoj ; Skukan, Natko ; Jakšić, Milko ; Matsuo, Jiro
engleski
Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility
We describe a new Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) setup for MeV SIMS application, which is constructed and installed at the heavy ion microbeam facility at the Ruđer Bošković Institute in Zagreb. The TOF-SIMS setup is developed for high sensitivity molecular imaging using a heavy ion microbeam that focuses ion beams (from C to I) with sub- micron resolution. Dedicated pulse processing electronics for MeV SIMS application have been developed, enabling microbeam-scanning control, incoming ion microbeam pulsing and molecular mapping. The first results showing measured MeV SIMS spectra as well as molecular maps for samples of interest are presented and discussed.
MeV SIMS ; heavy ion microbeam ; molecular imaging ; organic samples
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
332
2014.
234-237
objavljeno
0168-583X
10.1016/j.nimb.2014.02.068