engleski

Compton backscattering of Hf K X-rays in germanium

The differential cross section, $d^{2}\sigma /d\Omega dE$, for Compton scattering in germanium was measured by observing detector-to-detector scattering using the coincidence method. The experiment was performed at incident energies of 55.791 and 54.612 keV and scattering angle of $\vartheta=180^0$. The method applied is compared with the corresponding measurements in the singles mode, i.e. using the source-scatterer-detector assembly. We found that the coincidence method yields better results, especially in the region below the peak due to scattering on weakly bound electrons. However, it is restricted to investigation of Compton scattering in detector materials. Experimental results are compared with theoretical calculations based on the "$A^2$-Born" and the impulse approximations.

Coincidence measurement; Compton scattering

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