Oxidation of nickel surfaces by low energy ion bombardment (CROSBI ID 625946)
Prilog sa skupa u zborniku | sažetak izlaganja sa skupa
Podaci o odgovornosti
Šarić, Iva ; Peter, Robert ; Kavre, Ivna ; Jelovica Badovinac, Ivana ; Petravic, Mladen
engleski
Oxidation of nickel surfaces by low energy ion bombardment
Nickel oxide (NiO) is a good example of a p- type semiconducting oxide, with a wide range of possible applications, from electrochromic devices or chemical sensors to antiferromagnetic layers in spin valve structures. The quality of devices depends critically on the electrical properties of NiO films, thus it is important to fully understand the oxidation mechanisms of nickel that seems to be quite complex. We have shown recently that thin NiO films can be formed by bombardment of Ni surfaces with low energy oxygen ions. In the present study, we compare the formation of NiO films by the O2+ ion bombardment in the energy range of 0.5 - 5 keV with the thermal oxidation (RT to 500 oC) in oxygen atmosphere within an analytical ultrahigh vacuum chamber. The NiO films were analysed by X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) in order to determine different oxidation stages, stoichiometry and thickness of oxide films. We show that low energy oxygen- ion bombardment produces compact, more ordered and less amorphous oxide structures than films formed by some electrochemical methods.
XPS; nickel oxide; ion-bombardment; SIMS; thermal oxidation
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Podaci o prilogu
227-227.
2015.
objavljeno
Podaci o matičnoj publikaciji
Book of Abstracts: 22nd International Conference on Ion Beam Analysis
Bogdanović Radović, Iva ; Jakšić, Milko ; Karlušić, Marko ; Vidoš, Ana
Zagreb: Institut Ruđer Bošković
978-953-7941-07-9
Podaci o skupu
22nd International Conference on Ion Beam Analysis
poster
14.06.2015-19.06.2015
Opatija, Hrvatska