engleski

Bimodal magnetic force microscopy with capacitive tip-sample distance control

A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary top system is used to mechanically excite a high quality factor cantilever under vacuum conditions on its first mode and via an os The obtained second mode oscillation amplitude is then used as a proxy for the tip-sample distance, and for the control thereo sets reflecting the magnetic tip-sample interaction and the sample topography are simultaneously obtained.

magnetic force microscopy

nije evidentirano