Oxidation of nickel surfaces by low energy ion bombardment (CROSBI ID 223982)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Šarić, Iva ; Peter, Robert ; Kavre, Ivna ; Jelovica Badovinac, Ivana ; Petravić, Mladen
engleski
Oxidation of nickel surfaces by low energy ion bombardment
We have studied formation of oxides on Ni surfaces by low energy oxygen bombardment using X-ray photoemission spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). Different oxidation states of Ni ions have been identified in XPS spectra measured around Ni 2p and O 1s core-levels. We have compared our results with thermal oxidation of Ni and shown that ion bombardment is more efficient in creating thin oxide films on Ni surfaces. The dominant Ni-oxide in both oxidation processes is NiO (Ni2+ oxidation state), while some Ni2O3 contributions (Ni3+ oxidation state) are still present in all oxidized samples. The oxide thickness of bombarded Ni samples, as determined by SIMS, was shown to be related to the penetration depth of oxygen ions in Ni.
XPS; nickel oxide; ion-bombardment; SIMS; thermal oxidation
Rad je prezentiran na skupu The 22nd International Conference on Ion Beam Analysis (IBA 2015).
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
371
2015.
286-289
objavljeno
0168-583X
1872-9584
10.1016/j.nimb.2015.08.090