Nalazite se na CroRIS probnoj okolini. Ovdje evidentirani podaci neće biti pohranjeni u Informacijskom sustavu znanosti RH. Ako je ovo greška, CroRIS produkcijskoj okolini moguće je pristupi putem poveznice www.croris.hr
izvor podataka: crosbi

Holographic interferometric microscope for complete displacement determination (CROSBI ID 77170)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Kruschke, Oliver ; Wernicke, Guenther ; Huth, Torsten ; Demoli, Nazif ; Gruber, Hartmut Holographic interferometric microscope for complete displacement determination // Optical engineering, 36 (1997), 9; 2448-2456. doi: 10.1117/1.601420

Podaci o odgovornosti

Kruschke, Oliver ; Wernicke, Guenther ; Huth, Torsten ; Demoli, Nazif ; Gruber, Hartmut

engleski

Holographic interferometric microscope for complete displacement determination

Holographic microscopy for the simultaneous interferometric determination of all displacement components is described. The recording and the evaluation procedures are optimized by three illumination directions and conjugate reconstruction, respectively. Microscopic observation is completely separated from holographic recording. The holographic microscope performs maximum flexibility of magnification combined with high imaging accuracy. The phase-shift technique and Fourier analysis with a carrier frequency are applied for interferogram evaluation. Both methods are compared regarding the measurement range, accuracy, and handling. In-plane and out-of-plane displacement components can be measured simultaneously by both evaluation methods. A cantilever beam, a circular plate, and a surface-mounted microresistor are used to demonstrate the capabilities of the holographic microscope.

holographic microscopy; holographic interferometry

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

nije evidentirano

Podaci o izdanju

36 (9)

1997.

2448-2456

objavljeno

0091-3286

10.1117/1.601420

Povezanost rada

Fizika

Poveznice
Indeksiranost