engleski

Monitoring swift heavy ion damage kinetics using in situ RBS/c

The passage of a swift heavy ion (m > 20 amu, E > 1 MeV/amu) through a solid material can result in permanent damage along the ion’s trajectory that is commonly called an ion track. Origin of this nanoscale damage is due to ultrafast heating of the material by the incoming ion, and its subsequent rapid cooling. Thermal spike models describing this process predict ion track formation only when attained temperature on the position of ion impact surpasses melting point. In that case, amorphous phase is formed upon rapid quenching of the melt, and nanoscale amorphous inclusion can be found later as evidence of ion impact. In the present contribution we investigate ion tracks in quartz and fluorite using in situ Rutherford backscattering spectrometry in channeling (RBS/c). This novel approach enables detailed monitoring of damage build up within the material during swift heavy ion irradiation. This is in particular of interest close to the ion track formation threshold, when damage kinetics can provide additional information about ion track morphology [1]. [1] C. Grygiel, H. Lebius, S. Bouffard, A. Quentin, J. M. Ramillon, T. Madi, S. Guillous, T. Been, P. Guinement, D. Lelièvre, and I. Monnet, Rev. Sci. Instr. 83 (2012) 013902.

swift heavy ion; ion track; RBS/c

nije evidentirano